Gaya APA
Hosmer, David W., Lemeshow, Stanley. (2000).
Applied logistic regression / David W. Hosmer, Stanley Lemeshow (2nd ed).
New York:
John Wiley & Sons.
Gaya Chicago
Hosmer, David W., Lemeshow, Stanley.
Applied logistic regression / David W. Hosmer, Stanley Lemeshow.
2nd ed
New York:
John Wiley & Sons,
2000.
Text.
Gaya MLA
Hosmer, David W., Lemeshow, Stanley.
Applied logistic regression / David W. Hosmer, Stanley Lemeshow.
2nd ed
New York:
John Wiley & Sons,
2000.
Text.
Gaya Turabian
Hosmer, David W., Lemeshow, Stanley.
Applied logistic regression / David W. Hosmer, Stanley Lemeshow.
2nd ed
New York:
John Wiley & Sons,
2000.
Print.