Gaya APA

Tiwana, Amrit, Keil, Mark. (). Does peripheral knowledge complement control? an empirical test in technology outsourcing alliances . : John Wiley & Sons.

Gaya Chicago

Tiwana, Amrit, Keil, Mark. Does peripheral knowledge complement control? an empirical test in technology outsourcing alliances. : John Wiley & Sons, . Text.

Gaya MLA

Tiwana, Amrit, Keil, Mark. Does peripheral knowledge complement control? an empirical test in technology outsourcing alliances. : John Wiley & Sons, . Text.

Gaya Turabian

Tiwana, Amrit, Keil, Mark. Does peripheral knowledge complement control? an empirical test in technology outsourcing alliances. : John Wiley & Sons, . Print.